Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices
In this study we investigate the influence of the operation here method in Kelvin probe force microscopy (KPFM) on the measured potential distribution.KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film transistors or on cross sections of functional solar cells.Quantitative surface potential meas